Thermal properties

Optical properties

Spectroscopic ellipsometry is an optical measurement technique for investigating the optical properties (complex refractive index function) of thin films, nanomaterials, multilayers ...

Mechanical Properties

Electrical properties

Optoelectronic properties

Optoelectronic properties represent a very broad topic. During lectures, we discuss methods for developing thin films materials, in particular pulsed laser ablation to synthesize nanostructures and nanoparticles. The interactions between photons and electrons are discussed. The emphasis is on magnetic material, optical characterizations such as the Faraday and Kerr effect and the polarization of light. Different applications, on the nanometer and micrometer scale, are shown, representing a wide range of application over the next 10 years.


Electron Microscopy

This course first focuses on the principle of the SEM functioning. It begins by a first presentation that gives an overview of the different componants of the apparatus. The different components of the SEM and their functioning will be given in the forthcoming lessons. The following of this first lesson is then dedicated to the functionning of the electron gun.  

X-Ray Diffraction

Vibrational spectroscopy

Surface characterization

X-ray photoelectron spectroscopy (XPS), alternatively named electron spectroscopy for chemical analysis (ESCA), is now a well-established surface analysis technique capable of providing elemental and chemical state information from the outer 5 to 10 nm of a solid surface.